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NI PXI-6122 S Series

NI PXI-6122 S Series

$711.00

NI PXI-6122 is a high-performance multifunction DAQ module designed for precision data acquisition and signal generation. Featuring 16-bit resolution and simultaneous sampling, it ensures accurate and reliable measurements for complex industrial automation tasks. Its compact PXI form factor allows seamless integration into existing systems, boosting efficiency and productivity. Backed by a one-year warranty, you can trust in its durability and quality. Upgrade your testing capabilities today – order the NI PXI-6122 now!

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Description

NI PXI-6122 S Series

Product name: PXI-6122 NI

Application scenario: Suitable for Factory Automation, Process Control, and Advanced Test Measurement applications in automotive, aerospace, and electronics manufacturing industries

Core function description:

The NI module mainly implements high-precision data acquisition and signal conditioning to support efficient communication between measurement systems and control devices for accurate real-time monitoring and analysis.

Technical parameters:

– Communication rate range: Up to 1 MS/s per channel

– Interface types and quantities: 8 analog input channels, 2 analog output channels, 24 digital I/O lines

– Power supply and power consumption: 5 V DC, 4 W typical

– Installation and compatibility: PXI Express compatible, fits in PXI chassis slots, compatible with NI PXI controllers and third-party PXI chassis

– Supported protocol list: NI-DAQmx driver compatibility, IEEE-1588 for time synchronization

Featured functions:

– Programming and configuration capabilities: Configurable via NI Measurement Automation Explorer (MAX) and LabVIEW environment

– Fixed upgrade method: Firmware upgrade through NI MAX or PXI chassis controller interface

– Data communication mode: Supports continuous streaming and finite acquisition modes with hardware-timed sampling

– Integrated management function: Diagnostic LEDs for channel status and error reporting, onboard self-calibration routines

– Animation design features: Supports graphical data visualization and waveform monitoring through LabVIEW front panels

– Time synchronization features: Precision Time Protocol (PTP) IEEE 1588 support for synchronized multi-device measurements

Application advantages:

High channel density with precise timing and flexible configuration enhances measurement accuracy and system integration for demanding industrial testing environments.

Manufacturer link: Manufacturer Website (Link unavailable)

Contact information: Contact Us

The above parameters are for reference only. Please contact our technical team for precise selection.

Additional information

Product name

PXI-6122 NI

Application scenario

Suitable for Factory Automation, Process Control, and Advanced Test Measurement applications in automotive, aerospace, and electronics manufacturing industries

Core function description
Technical parameters
- Communication rate range

Up to 1 MS/s per channel

- Interface types and quantities

8 analog input channels, 2 analog output channels, 24 digital I/O lines

- Power supply and power consumption

5 V DC, 4 W typical

- Installation and compatibility

PXI Express compatible, fits in PXI chassis slots, compatible with NI PXI controllers and third-party PXI chassis

- Supported protocol list

NI-DAQmx driver compatibility, IEEE-1588 for time synchronization

- Programming and configuration capabilities

Configurable via NI Measurement Automation Explorer (MAX) and LabVIEW environment

- Fixed upgrade method

Firmware upgrade through NI MAX or PXI chassis controller interface

- Data communication mode

Supports continuous streaming and finite acquisition modes with hardware-timed sampling

- Integrated management function

Diagnostic LEDs for channel status and error reporting, onboard self-calibration routines

- Animation design features

Supports graphical data visualization and waveform monitoring through LabVIEW front panels

- Time synchronization features

Precision Time Protocol (PTP) IEEE 1588 support for synchronized multi-device measurements

Application advantages
Contact information

Contact Us

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