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NI PXI-2576 CompactRIO controller

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NI PXI-2576 CompactRIO controller

Original price was: $490.00.Current price is: $448.00.

NI PXI-2576 is a high-performance 40-channel multiplexer module designed for precise signal routing in automated test systems. Featuring fast switching speeds and robust isolation, it ensures accurate and reliable measurements in complex testing environments. Backed by a one-year warranty, this module guarantees durability and peace of mind. Enhance your testing efficiency with NI’s trusted technology. Order now to optimize your automation setup!

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Description

NI PXI-2576 CompactRIO controller

Product name: PXI-2576 NI

Application scenario: Suitable for automated test systems, electronic device validation, and high-density switching applications in aerospace, automotive, and semiconductor manufacturing industries

Core function description:

The NI module mainly implements high-density, high-speed multiplexing and switching to support efficient signal routing between test instruments and devices under test (DUTs) in PXI test systems.

Technical parameters:

– Communication rate range: Up to 100 MHz signal bandwidth

– Interface types and quantities: 40 single-pole, 2-wire relay channels

– Power supply and power consumption: 5 V DC, 8 W typical

– Installation and compatibility: PXI Express compliant, compatible with NI PXI chassis and controllers

– Supported protocol list: Compatible with IEEE 488.2 and SCPI command sets for test instrument control

Featured functions:

– Programming and configuration capabilities: Configurable via NI Measurement Automation Explorer (MAX) and LabVIEW software development environment

– Fixed upgrade method: Firmware upgrade through PXI controller interface

– Data communication mode: Sequential and parallel switching modes for high-efficiency signal routing

– Integrated management function: Built-in relay status monitoring and diagnostic indicators accessible through software APIs

– Animation design features: Supports custom visualization of switching matrices within LabVIEW graphical interface

– Time synchronization features: Synchronization achievable via PXI trigger and timing bus for coordinated switching operations

Application advantages: Enhanced test system modularity and scalability with reliable high-density switching, reducing test times and improving signal integrity in complex industrial testing environments. For more product details, please visit Manufacturer Website (Link unavailable). For inquiries, contact us at Contact Us.

The above parameters are for reference only. Please contact our technical team for precise selection.

Additional information

Product name

PXI-2576 NI

Application scenario

Suitable for automated test systems, electronic device validation, and high-density switching applications in aerospace, automotive, and semiconductor manufacturing industries

Core function description
Technical parameters
- Communication rate range

Up to 100 MHz signal bandwidth

- Interface types and quantities

40 single-pole, 2-wire relay channels

- Power supply and power consumption

5 V DC, 8 W typical

- Installation and compatibility

PXI Express compliant, compatible with NI PXI chassis and controllers

- Supported protocol list

Compatible with IEEE 488.2 and SCPI command sets for test instrument control

- Programming and configuration capabilities

Configurable via NI Measurement Automation Explorer (MAX) and LabVIEW software development environment

- Fixed upgrade method

Firmware upgrade through PXI controller interface

- Data communication mode

Sequential and parallel switching modes for high-efficiency signal routing

- Integrated management function

Built-in relay status monitoring and diagnostic indicators accessible through software APIs

- Animation design features

Supports custom visualization of switching matrices within LabVIEW graphical interface

- Time synchronization features

Synchronization achievable via PXI trigger and timing bus for coordinated switching operations

Application advantages

Enhanced test system modularity and scalability with reliable high-density switching, reducing test times and improving signal integrity in complex industrial testing environments. For more product details, please visit Manufacturer Website (Link unavailable). For inquiries, contact us at Contact Us.

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