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NI PXI-2515 CompactRIO controller

NI PXI-2515 CompactRIO controller

$356.00

NI PXI-2515 is a high-performance PXI switch module designed to deliver reliable and precise signal routing for complex test systems. Featuring 32 channels with low crosstalk and fast switching speeds, it ensures accurate and efficient automated testing. Benefit from enhanced system flexibility and seamless integration with NI platforms. Backed by a one-year warranty, this module guarantees long-term durability and support. Upgrade your test setup today—order now to experience unmatched performance and reliability!

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Description

NI PXI-2515 CompactRIO controller

Product Model: PXI-2515

Product Description: The PXI-2515 is a high-performance PXI switch module designed for reliable multiplexing and signal routing in automated test systems. It provides seamless integration with PXI chassis for enhanced testing flexibility and precision.

Brand: NI

Origin: United States

Net Weight: 0.5 kg

Dimensions: 175 mm x 130 mm x 30 mm

Power Supply: 5 V DC, 3 A

Input/Output: 32 channels of single-pole double-throw (SPDT) switch configuration

Communication Interface: PXI bus with PCI Express (PCIe) compatibility

Use: Ideal for automated test equipment (ATE), signal routing, functional testing, and data acquisition in electronics manufacturing and research laboratories

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The above parameters are for reference only. Please contact our technical team for precise selection.

Additional information

Product Model

PXI-2515

Product Description

The PXI-2515 is a high-performance PXI switch module designed for reliable multiplexing and signal routing in automated test systems. It provides seamless integration with PXI chassis for enhanced testing flexibility and precision.

Brand

NI

Origin

United States

Net Weight

0.5 kg

Dimensions

175 mm x 130 mm x 30 mm

Power Supply

5 V DC, 3 A

Input/Output

32 channels of single-pole double-throw (SPDT) switch configuration

Communication Interface

PXI bus with PCI Express (PCIe) compatibility

Use

Ideal for automated test equipment (ATE), signal routing, functional testing, and data acquisition in electronics manufacturing and research laboratories

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